Intellectual Property India Publishes Patent Application for 'Method And System Of Detecting Defects In Track Rails' Filed by L&T Technology Services Limited

MUMBAI, India, March 14 -- Intellectual Property India has published a patent application (202441069223 A) filed by L&T Technology Services Limited, Chennai, Tamil Nadu, on Sept. 12, 2024, for 'method and system of detecting defects in track rails.'

Inventor(s) include Niranjan Narottam Keer; Aradhya Prasad Mukherjee; and Uday Kiran Bonthu.

The application for the patent was published on March 13, under issue no. 11/2026.

According to the abstract released by the Intellectual Property India: "A method (400) and system (100) for detecting defects in track rails is disclosed. A processor (104) receives imaging data of one or more-track rails (302) in real-time using an imaging device (112) coupled to a railway train. A set of image frames of the one or more-track rails (302) are determined for each time instance. A first processed frame (300A) is determined from the set of image frames based on detection of at least one first defect from a set of predefined defects in the set of image frames using a first artificial intelligence (AI) model. The first processed frame (300A) is processed to determine a second processed frame (300B) from the first processed frame (300A) based on detection of at least one second defect from the set of predefined defects in the first processed frame (300A) using a second AI model."

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