MUMBAI, India, Nov. 21 -- Intellectual Property India has published a patent application (202544039487 A) filed by Abb Schweiz Ag, Baden, Switzerland, on April 24, for 'method and a system for assessing the reliability of field device data.'
Inventor(s) include Roman Mukin; and Kai Alfred Hencken.
The application for the patent was published on Nov. 21, under issue no. 47/2025.
According to the abstract released by the Intellectual Property India: "The invention relates to a computer-implemented method for assessing the reliability of field device data comprising the steps: starting (100) an individual cycle; receiving (102) reliability-related data from field devices; calculating (104) and accumulating a first reliability value and/or a first hazard value over a yet undetermined time span without compression according to a model that uses at least one variable representing the reliability-related data; calculating (106) and accumulating a second reliability value and/or a second hazard value over the yet undetermined time span with compression according to the model, which uses the at least one variable representing the reliability-related data, wherein the values of the at least one variable are compressed; comparing (108) the first and the second reliability and/or second hazard values to a related pre-defined threshold corresponding to an accuracy; if exceeding the threshold (110), stopping (112) the calculation of the first and the second reliability and/or hazard values and determining the time span; and storing (114) the compressed values of the at least one variable; and closing (116) the individual cycle."
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