MUMBAI, India, April 17 -- Intellectual Property India has published a patent application (202531091735 A) filed by Narula Institute Of Technology, Kolkata, West Bengal, on Sept. 25, 2025, for 'measurement of healthy and unhealthy leaves using image processing.'
Inventor(s) include Mr. Suman Kumar Bhattacharya; Mr. Soumya Bhattacharya; Mrs. Sujata Kundu; Mr. Debabrata Maity; Mr. Akash Karmakar; Mr. Sayan Saha; and Mr. Ramya Mitra.
The application for the patent was published on April 17, under issue no. 16/2026.
According to the abstract released by the Intellectual Property India: "In the present invention convolutional neural networks (CNNs) and MobileNetV2 are used to provide a deep learning-based method to detect diseases in the leaves of rice and wheat plants. To improve performance, the model utilization of data augmentation and transfer learning techniques. For testing, validation, and training, a data set of pictures of wheat and rice leaf is utilized. 90.6% test accuracy was obtained by the suggested model, indicating its potential as a trustworthy instrument for agricultural early disease diagnosis. This strategy provides a scalable, economical, and effective way to reduce crop losses and raise agricultural output."
Disclaimer: Curated by HT Syndication.
