MUMBAI, India, Aug. 29 -- Intellectual Property India has published a patent application (202517075834 A) filed by Satake Corporation, Tokyo, on Aug. 8, for 'measurement device and selection device.'
Inventor(s) include Hiwada Kanji; Okimoto Kohtaro; and Miyamoto Tomoyuki.
The application for the patent was published on Aug. 29, under issue no. 35/2025.
According to the abstract released by the Intellectual Property India: "This measurement device for measuring the state of an object comprises: a transporting unit configured to transport the object; an electromagnetic wave irradiation source configured to irradiate the object, which is being transported by the action of the transporting unit, with electromagnetic waves; a line sensor; an area sensor; and an identification unit configured to identify the state of the object on the basis of a first image acquired by the line sensor and a second image acquired by the area sensor. The measurement device is configured such that a first detection region in which the line sensor detects the object overlaps, or is adjacent to, a second detection region in which the area sensor detects the object."
The patent application was internationally filed on Jan. 12, 2024, under International application No.PCT/JP2024/000609.
Disclaimer: Curated by HT Syndication.
