MUMBAI, India, Nov. 7 -- Intellectual Property India has published a patent application (202547095961 A) filed by Tokyo Seimitsu Co. Ltd., Tokyo, on Oct. 6, for 'measurement device.'
Inventor(s) include Maeda Kunihiro.
The application for the patent was published on Nov. 7, under issue no. 45/2025.
According to the abstract released by the Intellectual Property India: "A measurement device (1) is provided with a stylus for measuring the surface of an object to be measured, and comprises: a detector (10) including a stylus section (14) attached so as to be swingable around a swing center according to the shape of the surface of the object to be measured; a thermometer (80) that measures the temperature at the time of measurement by the stylus section; a temperature correction parameter storage unit (108) that stores temperature correction parameters corresponding to the type of the stylus section, the temperature at the time of measurement that was measured by the thermometer, and the temperature at the time of calibration; and a temperature correction unit (102) that detects the type of the stylus section used in the measurement, acquires the temperature correction parameter corresponding to the type of the stylus section, the temperature at the time of measurement that was measured by the thermometer, and the temperature at the time of calibration from the temperature correction parameter storage unit and corrects the measurement result on the basis of the temperature correction parameter."
The patent application was internationally filed on Mar. 08, 2024, under International application No.PCT/JP2024/008970.
Disclaimer: Curated by HT Syndication.
