MUMBAI, India, Nov. 7 -- Intellectual Property India has published a patent application (202547095774 A) filed by Tokyo Seimitsu Co. Ltd., Tokyo, on Oct. 6, for 'measurement device.'
Inventor(s) include Maeda Kunihiro; and Morii Hideki.
The application for the patent was published on Nov. 7, under issue no. 45/2025.
According to the abstract released by the Intellectual Property India: "A measurement device (1) comprises: a detector (10) that is accommodated in an internal space of a detector housing (30) and includes an arm part attached so as to be able to oscillate about an oscillation center; a stylus part (14) provided with a stylus for performing measurement of a surface of a measurement object, the stylus part being attached to the arm part and being attached so as to be able to oscillate integrally with the arm part in accordance with the shape of the surface of the measurement object; a first temperature sensor that measures the temperature of the internal space, and a temperature correction unit (102) that corrects the result of measurement of the measurement object on the basis of the temperature, measured by the first temperature sensor, of the internal space during measurement."
The patent application was internationally filed on Mar. 08, 2024, under International application No.PCT/JP2024/008971.
Disclaimer: Curated by HT Syndication.
