Intellectual Property India Publishes Patent Application for 'Learning Model Generation Device, Inspection Value Prediction Device, Learning Model Generation Method, Inspection Value Prediction Method, And Computer-Readable Recording Medium' Filed by Nec Solution Innovators, Ltd.

MUMBAI, India, Oct. 11 -- Intellectual Property India has published a patent application (202517090419 A) filed by Nec Solution Innovators, Ltd., Tokyo, on Sept. 22, for 'learning model generation device, inspection value prediction device, learning model generation method, inspection value prediction method, and computer-readable recording medium.'

Inventor(s) include Nomura, Hitoshi; and Kato, Shintaro.

The application for the patent was published on Oct. 10, under issue no. 41/2025.

According to the abstract released by the Intellectual Property India: "This learning model generation device 10 is equipped with a learning model generation unit 11 which, when a function expressing a change in an inspection value obtained by inspecting a person is set, generates a learning model in which the inspection value is the explanatory variable and the parameter is the objective variable, by performing machine learning using inspection values of sample people and parameters of the function for the sample people as training data."

The patent application was internationally filed on Mar. 14, 2024, under International application No.PCT/JP2024/009956.

Disclaimer: Curated by HT Syndication.