MUMBAI, India, Feb. 27 -- Intellectual Property India has published a patent application (202621004993 A) filed by Smita Satish Pawar; Dr. Mangesh Dindayal Nikose; and Dr. Anni Udaybhan Gupta, Pune, Maharashtra, on Jan. 19, for 'intelligent nuchal translucency measurement and risk assessment system for early genetic disorder screening.'
Inventor(s) include Smita Satish Pawar; Dr. Mangesh Dindayal Nikose; and Dr. Anni Udaybhan Gupta.
The application for the patent was published on Feb. 27, under issue no. 09/2026.
According to the abstract released by the Intellectual Property India: "The present invention discloses an Intelligent Nuchal Translucency Measurement and Risk Assessment System for Early Genetic Disorder Screening comprising an image acquisition unit, image processing unit, CNN-based detection unit, segmentation unit, NT thickness measurement unit, clustering and labeling unit, risk classification unit, and a visualization and report unit. The system analyzes first-trimester fetal ultrasound images by refining the input image through noise reduction, contrast improvement, and boundary enhancement. The CNN-based detection unit identifies the nuchal translucency region, which is accurately extracted by the segmentation unit. The NT thickness measurement unit calculates the thickness of the segmented region, while the clustering and labeling unit stabilizes the measured values. Based on the finalized NT measurement, the risk classification unit categorizes the likelihood of genetic disorders. The visualization and report unit presents the NT measurement and corresponding risk information in a structured format to support early prenatal screening and clinical evaluation."
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