Intellectual Property India Publishes Patent Application for 'In-Situ 3-Axis Defect Growth Scanner For Cfrp Composites Subject To Testing Under Static And Cyclic Loading' Filed by Illinois Tool Works, Inc.

MUMBAI, India, Sept. 5 -- Intellectual Property India has published a patent application (201641022664 A) filed by Illinois Tool Works, Inc., Glenview, U.S.A., on July 1, 2016, for 'in-situ 3-axis defect growth scanner for cfrp composites subject to testing under static and cyclic loading.'

Inventor(s) include Pradeep. K; Chandru Haralakere Puttaswamy; Murali Mohan; Sunder Ramasubbu; and Somayya Ammanagi.

The application for the patent was published on Sept. 5, under issue no. 36/2025.

According to the abstract released by the Intellectual Property India: "The present invention relates to an integrated system and method for in-situ 3-axis scanning and detecting defects in a CFRP composite being loaded under static and cyclic test conditions. The system comprises a test system integrated with a scanning system that comprises a probe assembly to generate eddy current on the surface of the CFRP composite mounted on the test system, and a 3D scanner assembly for movement of the probe assembly over the entire surface area of the CFRP composite along X-axis, Y-axis and Z-axis. An operator console is connected to the test system and the scanning system for controlling mechanical test process in the test system and for controlling 3-dimensional movement of the probe assembly along X-axis, Y-axis and Z-axis in a synchronous manner. Such system and method achieve automated and synchronized 3D scanning of the CFRP composite to accurately detect the defects in the CFRP composite before/during/after mechanical testing without interrupting the mechanical test process."

Disclaimer: Curated by HT Syndication.