MUMBAI, India, Feb. 27 -- Intellectual Property India has published a patent application (202641017336 A) filed by Adhithyan V J; Akshay Ajith; Aibel Geevarghese Saju; Alen Abraham; and Er. Varun Mathew Idiculla, Kottayam, Kerala, on Feb. 17, for 'hybrid opto-acoustic system for concurrent volumetric defect detection and surface metrology.'
Inventor(s) include Adhithyan V J; Akshay Ajith; Aibel Geevarghese Saju; Alen Abraham; and Er. Varun Mathew Idiculla.
The application for the patent was published on Feb. 27, under issue no. 09/2026.
According to the abstract released by the Intellectual Property India: "This invention discloses a hybrid non-destructive testing (NDT) and metrology architecture integrating a laser-based excitation source with an ultrasonic receiver to facilitate concurrent internal defect detection and surface roughness analysis. The system utilizes a laser probe to generate thermoelastic waves for volumetric inspection while simultaneously employing optical interferometry to map micro-scale surface topography. By leveraging an Adaptive Dynamic Frequency Sweeping (ADFS) algorithm, the apparatus optimizes signal-to-noise ratios across varying material densities to identify delaminations and inclusions without liquid couplants. This dual-probe, non-contact configuration enables high-speed, automated data fusion, providing a comprehensive structural and topographic profile of high-precision components within a single inspection cycle."
Disclaimer: Curated by HT Syndication.
