MUMBAI, India, Feb. 13 -- Intellectual Property India has published a patent application (202611001995 A) filed by Lovely Professional University, Phagwara, Punjab, on Jan. 8, for 'digital field inspection and traceability platform.'
Inventor(s) include Dipanjali Gupta; Saad Alam; Shubham Lamba; Alapan Dey; and Suhel Mehandi.
The application for the patent was published on Feb. 13, under issue no. 07/2026.
According to the abstract released by the Intellectual Property India: "The present invention discloses a Digital Field Inspection and Traceability Platform (100) designed to digitize field inspections and provide end-to-end traceability of lots or assets. The system (100) comprises a Field Client (102) for offline-first tamper-evident capture of structured checklists, photos, videos, and voice recordings, automatically binding time, geolocation, device, and user identity. A Sync Gateway (104) validates and reconciles events, forwarding them to an Orchestration & Compliance Engine (106) that evaluates rule packs and issues Corrective Action Requests (CARs). A Traceability & Evidence Layer (108) maintains an append-only custody graph linking inspections, transfers, splits/merges, lab results, and disposition events to a Unique Digital Identifier (UDI) (114). The Analytics & Reporting Dashboard (110) generates KPI cards, risk heatmaps, and signed dossiers. Interoperability Connectors (112) enable integration with ERP, laboratory systems, regulator portals, and IoT telemetry, ensuring verifiable, audit-ready reporting and industrial applicability."
Disclaimer: Curated by HT Syndication.
