Intellectual Property India Publishes Patent Application for 'Detect High-Impact Conflict Using Parameter Dependency Graph In O-Ran' Filed by Rakuten Symphony, Inc.

MUMBAI, India, April 20 -- Intellectual Property India has published a patent application (202411076232 A) filed by Rakuten Symphony, Inc., Tokyo, on Oct. 8, 2024, for 'detect high-impact conflict using parameter dependency graph in o-ran.'

Inventor(s) include Kalita, Manisha; and Chhawchharia, Manjari.

The application for the patent was published on April 17, under issue no. 16/2026.

According to the abstract released by the Intellectual Property India: "Embodiments of the disclosure describe a method for determining one or more high-impact conflicts. The method 1000 includes receiving a plurality of control parameters from a plurality of applications (e.g., 101a,...., 101n). The method 1000 includes generating one or more dependency graphs. The one or more dependency graphs are generated based on the plurality of received control parameters and a plurality of system impacts caused by the plurality of received control parameters. The plurality of system impacts is categorized into at least one of a functional impact and a KPI impact. The method 1000 includes determining one or more high-impact conflicts among the plurality of applications (e.g., 101a,...., 101n) based on the one or more generated dependency graphs. The one or more high-impact conflicts are determined among at least one of the one or more direct conflicts, the one or more indirect conflicts, and the one or more implicit conflicts."

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