MUMBAI, India, Feb. 27 -- Intellectual Property India has published a patent application (202641017400 A) filed by Mohan Babu University, Tirupati, Andhra Pradesh, on Feb. 17, for 'design of built in self test for embedded master slave communication using i2c protocol.'
Inventor(s) include Ms. B. Hari Chandana; Ms. Nune Divya; Ms. M. Snehitha; Ms. P. Srujana; Mr. Veera Dileep Yadav; and Mr. G. Tej Tharun.
The application for the patent was published on Feb. 27, under issue no. 09/2026.
According to the abstract released by the Intellectual Property India: "The present invention discloses a Built-In Self-Test (BIST) system designed to enhance the reliability and performance of embedded communication interfaces. This system integrates a Test Pattern Generator (TPG), Test Controller, and Output Response Analyzer (ORA) directly within the communication interface, enabling real-time, autonomous fault detection and self-testing during normal system operation. The BIST system is particularly effective for embedded communication protocols such as I2C, SPI, UART, and CAN, offering comprehensive fault monitoring without the need for external test equipment. Key innovations include a minimal power and area-efficient design, making the system suitable for resource-constrained environments like mobile devices, wearable electronics, IoT devices, and automotive electronics. The BIST system's design ensures that the fault detection process incurs minimal overhead, reducing power consumption by up to 6% and area requirements by 7% while improving detection speed to less than 20 clock cycles. Additionally, the system includes robust fault logging and reporting features, which record faults for diagnostic purposes and provide valuable insights for system maintenance. The adaptability of the system to multiple protocols and its ability to perform fault detection autonomously or manually, during idle states or normal operation, ensures broad applicability across various embedded systems, ranging from consumer electronics to industrial control and aerospace applications."
Disclaimer: Curated by HT Syndication.
