MUMBAI, India, April 10 -- Intellectual Property India has published a patent application (202544094064 A) filed by Kobelco Research Institute, Inc., Hyogo, Japan, on Sept. 30, 2025, for 'contour shape measurement device and method for the same.'
Inventor(s) include Nishiyama Kohei; and Furuta Yohei.
The application for the patent was published on April 10, under issue no. 15/2026.
According to the abstract released by the Intellectual Property India: "The present invention is a contour shape measurement device that measures a contour shape of a peripheral edge of a measurement target on a basis of a shadow image obtained by imaging a shadow of the peripheral edge generated by projecting parallel light from a tangential direction of an outer periphery to the peripheral edge, and controls first to third support members for supporting the measurement target in order to make the parallel light and a surface of the measurement target parallel along a light projection direction. The first to third support members include first to third moving mechanisms that move the first to third support positions of the measurement target in a vertical direction, and in the control, the first to third moving mechanisms are individually controlled."
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