MUMBAI, India, Feb. 27 -- Intellectual Property India has published a patent application (202621003336 A) filed by Ms. Seema Murkar; Ms. Ketaki Ghawali; Mr. Rajendra Patole; Ms. Mithila Chavan; Ms. Chhaya Sharma; and Ms. Prachi Kumathekar, Maharashtra, on Jan. 12, for 'an integrated multi-stage image enhancement and crater detection system for lunar permanently shadowed regions.'
Inventor(s) include Ms. Seema Murkar; Ms. Ketaki Ghawali; Mr. Rajendra Patole; Ms. Mithila Chavan; Ms. Chhaya Sharma; and Ms. Prachi Kumathekar.
The application for the patent was published on Feb. 27, under issue no. 09/2026.
According to the abstract released by the Intellectual Property India: "The present invention relates to an integrated multi-stage image enhancement and analysis system for optical imagery acquired from lunar permanently shadowed regions, where extreme low illumination, high noise levels, and limited spatial resolution restrict conventional analysis. The disclosed system processes a low-light lunar image through a sequential pipeline comprising illumination enhancement using a zero-reference deep curve estimation model, noise suppression via non-local means filtering, super-resolution reconstruction using a generative adversarial network, and automated crater detection using a real-time object detection model. The system operates on individual images using pre-trained models, thereby eliminating the need for large labeled datasets and high-performance computing infrastructure. Optional post-processing enables refinement and visualization of the output images for scientific interpretation. The invention significantly improves image clarity, preserves critical lunar surface features, and enhances detection accuracy, thereby supporting reliable mapping, analysis, and exploration of lunar permanently shadowed regions."
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