MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202641064553 A) filed by Vellore Institute Of Technology, Vellore, Tamil Nadu, on May 21, for 'ai-based system for non-invasive endometriosis detection using symptom pattern analysis.'
Inventor(s) include Dr. Bhawana Tyagi.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "AI-Based System for Non-Invasive Endometriosis Detection Using Symptom Pattern Analysis The present invention relates to an artificial intelligence-based system for non-invasive detection of endometriosis using symptom pattern analysis. The system acquires patient-reported symptoms, clinical history, and lifestyle data through digital interfaces and processes the data using preprocessing and structuring techniques. A pattern analysis module identifies temporal and co-occurring symptom patterns and converts them into structured features. An artificial intelligence prediction module processes these features to generate a diagnostic risk score and classify patients into risk categories including low, moderate, and high risk. The system further includes an explanation generation component that provides interpretable outputs linking symptom patterns to diagnostic outcomes. The results are presented to clinicians through a decision-support interface. A continuous learning module updates the predictive model using feedback and new data. The invention enables early detection of endometriosis, reduces dependence on invasive procedures, and improves diagnostic accuracy and clinical decision-making."
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