MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202641063787 A) filed by Aneesh Sai Basavaraju, Hyderabad, Telangana, on May 20, for 'ai-based probabilistic exam pattern analysis and personalizedstudy optimization system.'
Inventor(s) include Aneesh Sai Basavaraju.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "Exemplary embodiments of the present disclosure are directed toward AI-Based probabilistic exam pattern analysis and personalized study optimization system. It includes a historical examination data collection module that acquires past papers across multiple years. A question tagging module annotates each question with topic, marks, type, and year metadata. A probabilistic scoring engine computes Topic Importance Scores using base probability, recency decay, and marks-weight factors. A trend analysis module applies regression and pattern recognition to detect frequency trends and cyclical intervals, refining importance scores. A student profiling module calculates topic-wise Weakness Coefficients from user inputs. A study optimization engine combines importance scores with weakness coefficients to derive Priority Scores and allocates study hours proportionally across topics. A plan delivery module presents a personalized study plan with recommended hours per topic, priority rankings, probability-based rationale, and revision scheduling-enabling mathematically optimized, data-driven exam preparation tailored to individual student profiles."
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