MUMBAI, India, Jan. 9 -- Intellectual Property India has published a patent application (202521118310 A) filed by Dr. Ratna Vivek Panvekar; Ananth Aparna Sumanjali; Dr. Shankar Rao Munjam; and Dr. A. B. Vedamurthy, Maharashtra, on Nov. 27, 2025, for 'ai-assisted microwave dielectric properties of seeds for quality control.'
Inventor(s) include Dr. Ratna Vivek Panvekar; Ananth Aparna Sumanjali; Dr. Shankar Rao Munjam; and Dr. A. B. Vedamurthy.
The application for the patent was published on Jan. 9, under issue no. 02/2026.
According to the abstract released by the Intellectual Property India: "The present invention relates to an AI-assisted microwave dielectric seed quality evaluation system capable of real-time, non-destructive analysis of agricultural seeds. The system integrates a microwave signal generator, dielectric sensing chamber, data acquisition unit, and machine learning classification engine to measure dielectric properties such as permittivity and loss factor. These parameters are used to classify seed quality and predict germination potential and shelf-life. The system also supports automated sorting and cloud-based monitoring. This scalable solution provides accurate quality grading for seed processors, certification bodies, and agricultural research institutions. By eliminating destructive testing and manual errors, the invention improves efficiency, reduces waste, and supports precision agriculture, thereby contributing to improved crop yield and enhanced food security."
Disclaimer: Curated by HT Syndication.
