MUMBAI, India, July 11 -- Intellectual Property India has published a patent application (202541060950 A) filed by Ghali Venkata Subbarao; and Koneru Lakshmaiah Education, Guntur, Andhra Pradesh, on June 26, for 'a low-cost infrared imaging system and an improved axial resolution-based method for subsurface analysis of composites.'
Inventor(s) include G V Subbarao; Shaik Aashik; and Baloji Naik R.
The application for the patent was published on July 11, under issue no. 28/2025.
According to the abstract released by the Intellectual Property India: "Evaluation of subsurface integrity of objects is crucial for many industrial applications as it decides the performance, strength and durability. Among the available state of art non-invasive evaluation procedures, thermal wave imaging is gaining interest due to its non-contact, whole field and remote evaluation capabilities. Cost, installation and testing requirements of thermal wave imaging systems limit their applicability to lab-based testing and make them ineffective in semi closed and high-altitude environments for the estimation of integrity of objects in industrial applications. Compact imaging systems facilitating the accessibility of remote industrial objects, for in-situ inspection, has become a challenging task, keeping in view of the system size, spatial resolution and cost of the existing thermal imaging systems. Present subject introduces a low-cost thermal imaging system with led flood light based low power quadratic chirp stimulation thermal wave imaging system to detect subsurface anomalies with dedicated chirp Z transform based processing approach intended for improving depth resolution and depth scanning capabilities."
Disclaimer: Curated by HT Syndication.
