MUMBAI, India, May 29 -- Intellectual Property India has published a patent application (202641064473 A) filed by Vellore Institute Of Technology, Vellore, Tamil Nadu, on May 21, for 'a closed-loop radiographic inspection system and method for defect detection and depth estimation.'
Inventor(s) include Dr. Priya V; Sanjay Kanna V; Mohammed Arfath R; Gopi C K; Gokul Kanna V; Naresh R; and Sheeba S.
The application for the patent was published on May 29, under issue no. 22/2026.
According to the abstract released by the Intellectual Property India: "The present invention relates to a closed-loop radiographic inspection system (100) and a corresponding method (200) for defect detection and depth estimation in non-destructive testing. The system (100) comprises a radiographic image acquisition module (102) configured to capture images under controllable exposure parameters and transmit intensity data to a processing unit (104). A defect detection and segmentation module (108) identifies defects and extracts regions-of-interest, followed by a hybrid feature extraction module (110) combining convolutional and transformer-based features. A learnable attenuation estimation module (112) computes an effective attenuation coefficient (_eff), and a physics-based depth estimation module (114) determines defect depth using a Beer-Lambert law-based model with calibration. An adaptive acquisition control module (116) iteratively adjusts exposure parameters based on predictive uncertainty, while a severity evaluation module (118) classifies defects and an output interface module (120) generates inspection reports."
Disclaimer: Curated by HT Syndication.
